ANGLICKÁ ODBORNÁ LITERATÚRA Medicína Dermatopathology
Dermatopathology

Dermatopathology

High Yield Pathology

N. K. Brinster, V. Liu, H. Diwan, P. H. McKee

Elsevier Ltd , 2011

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O knihe

Save time diagnosing skin diseases with High Yield Dermatopathology, edited by Drs. Nooshin Brinster, Vincent Liu, Hafeez Diwan, and Phillip McKee. Part of the High Yield Pathology Series, this title is designed to help you review the key pathologic features of skin disease, recognize the classic look of each disease, and quickly confirm your diagnosis. Its templated format, excellent color photographs, concise bulleted text, and authoritative content, will help you accurately identify more than 400 skin conditions.

EAN: 9781416099765
ISBN: 9781416099765
Vydavateľstvo: Elsevier Ltd
Autori: N. K. Brinster, V. Liu, H. Diwan, P. H. McKee
Rok vydania: 2011
Počet strán: 624
Väzba: paperback
Jazyk: Anglický

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